The OS Dual Beam Laser Thickness Monitor (OS-LTM-VIS-IR) is designed for the use with low energy gap materials (Eg < 1.82 eV). The visible 632.8 nm laser is used for optical alignment while the infrared laser (830 nm) is used for measurement.
|Operation||remote and in situ|
|Laser wavelength (nm)||IR Laser 830 nm + alignment
laser 632.8 nm
|Port Mount||UHV DN40CF (standard)||other mountings on demand|
|Usage||for low Eg materials (Eg<1.82 eV)|
|Sensitivity (nm)||up to a few nm||depending on the refractive index|
for measuring Software
|Windows XP or more recent||desktop PC with a PCI slot*|
* An RF noise shielded PC (not included) is recommended for the use in connection with a PPD System.