Dual Beam Laser Thickness Monitor
Accessories
The OS Dual Beam Laser Thickness Monitor (OS-LTM-VIS-IR) is designed for the use with low energy gap materials (Eg < 1.82 eV). The visible 632.8 nm laser is used for optical alignment while the infrared laser (830 nm) is used for measurement.
Characteristics
Operation | remote and in situ | |
---|---|---|
Laser wavelength (nm) | IR Laser 830 nm + alignment laser 632.8 nm |
|
Port Mount | UHV DN40CF (standard) | other mountings on demand |
Usage | for low Eg materials (Eg<1.82 eV) | |
Sensitivity (nm) | up to a few nm | depending on the refractive index |
Operating System for measuring Software |
Windows XP or more recent | desktop PC with a PCI slot* |
* An RF noise shielded PC (not included) is recommended for the use in connection with a PPD System.